Chemical and Biomolecular Engineering Faculty Research

Title

Optimization of the Temporal Response of Ii-vi Direct Type Semiconductor Detectors for Flat-panel Pulsed X-ray Imaging

Document Type

Article

Publication Date

12-2001

Abstract

The rising and falling edges of detected signal pulses have been measured utilizing X-ray ionization of a planar Cd1-xZnx Te system under different irradiation geometries, at different detector thicknesses, and applied electric fields. The experimental results of this study indicate that the time response of the CdZnTe based X-ray system is suitable for digital pulsed radiographic applications

Publication Title

Instrumentation and Measurement

Volume

50

Issue

6

First Page

1610

Last Page

1614