Chemical and Biomolecular Engineering Faculty Research

Title

Detected Contrast and Dynamic Range Measurements of Cdznte Semiconductors for Flat-panel Digital Radiography

Document Type

Article

Publication Date

Fall 2001

Abstract

The detected contrast and dynamic ranges of Cd1-xZnxTe semiconductor detectors have been measured, within the X-ray diagnostic energy range, using a contrast sensitivity phantom. The aim of this study is to optimize the image quality parameters of these solid state ionization devices for flat panel digital radiographic applications. The experimental results of this study indicate that Cd1-xZnxTe detectors have excellent detected contrast response and large dynamic range

Volume

50

Issue

6

First Page

1604

Last Page

1609