Detected Contrast and Dynamic Range Measurements of Cdznte Semiconductors for Flat-panel Digital Radiography
The detected contrast and dynamic ranges of Cd1-xZnxTe semiconductor detectors have been measured, within the X-ray diagnostic energy range, using a contrast sensitivity phantom. The aim of this study is to optimize the image quality parameters of these solid state ionization devices for flat panel digital radiographic applications. The experimental results of this study indicate that Cd1-xZnxTe detectors have excellent detected contrast response and large dynamic range
Evans, Edward, "Detected Contrast and Dynamic Range Measurements of Cdznte Semiconductors for Flat-panel Digital Radiography" (2001). Chemical and Biomolecular Engineering Faculty Research. 409.